Tunable Vanadium Doping of Bilayer MoS2 by Co-Sputtering System for Electronic Applications
Zih-Siang Jian1,2*, Jie-Ru Yen1, Huai-En Zeng1, Wen-Hao Chang1,2,3
1Department of Electrophysics, National Yang Ming Chiao Tung University, HsinChu, Taiwan
2Research Center for Critical Issues, Academia South Sinica, Tainan, Taiwan
3Research Center for Applied Sciences, Academia Sinica, Taipei, Taiwan
* Presenter:Zih-Siang Jian, email:darke047.sc10@nycu.edu.tw
Molybdenum disulfide (MoS2) is gaining attention for its unique properties, such as nonzero-gap property and good electrical conductivity. However, developing reliable circuits using MoS2 still faces challenges, including a lack of precise control over carrier concentration, conductivity, threshold voltages, and high contact resistance. Developing an efficient strategy for doping the 2D materials is required for the state-of-the-art technology. Thus, Co-sputtering of 2D materials and dopant followed by post-growth sulfurization is considered as a feasible approach to control doping concentration of MoS2. In this work, we demonstrate a controllable doping in MoS2 by co-sputtering 2D materials and dopant on single-crystal MoS2 templates followed by post-growth sulfurization. We co-sputtered vanadium (V) with MoS2 onto a single-crystal MoS2 film for the p-type doping. Post-growth annealing in H2S was performed for healing the crystallinity after the co-sputtering. By controlling the sputtering parameters of dopants and MoS2, tunable p-type doping concentrations were achieved. Evidences of the V-doped MoS2 film was examined using Raman spectroscopy, photoluminescence (PL) spectroscopy, atomic force microscopy (AFM), X-ray photoelectron spectroscopy (XPS), energy dispersive spectroscopy (EDS), and scanning transmission electron microscopy (STEM). We successfully achieved degenerate p-type doping in the doped MoS2 field-effect transistors (FETs), indicating a significant enhancement in conductivity. This work provides a potential approach for doping MoS2, highlighting its promise for future electronic applications.
Keywords: TMDs, Molybdenum disulfide, Doping, Magnetron Co-sputtering, LPCVD